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The Nanomaterials Characterization Facility (NCF) at CU-Boulder is a facility to both educate students and avail itself to a community of top-notch researchers from academia, government labs, and industry representing a variety of disciplines. Our current instruments provide the latest-cutting edge technology allowing fabrication, characterization, imaging and probing of structures and materials on the nanoscale in multiple environments. The facility provides:
- affordable access to our state-of-the-art instruments
- personalized training on operation of instruments by our experienced staff
- on line user-scheduled instrument reservations on a first-come, first serve basis
- a gateway to an expanding CU wide network of nano instrumentation and services
Bacteria in Space: Behavior of Cells affected by Gravity
Professor David Klaus at CU is shedding light on how bacterial cells communicate with one another. By observing their behavior when launched into the zero gravity environment of outer space, he has determined that molecular transport is strongly driven by gravity.
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Laying the Foundation of Nanotech One Atom at-a-time
Despite being a relatively old technology -- first developed in 1976 -- Atomic Layer Deposition is evolving into perhaps one of the most important and influential techniques spurring nanotechnology and nanoscience forward.
Religion Guides Public Opinion of Nanotechnology in U.S.
Professor Scheufele specializes in public opinion and polling, specifically dealing with science and technology issues.
Nanofabrication in the Dual Beam Focused Ion Beam (FIB)
Kathy Schrader on 8/24/2008 at 08:41:49 AM
Virginia Polytechnic Institute and State University Post Doctoral Gurpreet Singh will share his experiences with the FIB for fabrication and characterization of structures involving nanotubes, cross-sectional imaging of biological materials and preparation of TEM specimens.
NCF Short Courses
Kathy Schrader on 8/20/2008 at 11:35:09 AM
We'd like to arrange more of the single day short courses and would like to hear your suggestions.
Low Vacuum Scanning Electron Microscope (LVSEM)
Field Emission Scanning Electron Microscope(FESEM)
Focused Ion Beam(FIB)
Atomic Force Microscope (AFM)
Confocal Laser Scanning Microscope (CLSM)
Thermal XP Indenter(NI)
XP/DCM Indenter(NI)