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Nanomaterials Characterization Facility
Nanomaterials Characterization Facility
NCF > Instruments > Descriptions

Instrument Descriptions

LVSEM
Low Vacuum Scanning Electron Microscope

FESEM
Field Emission Scanning Electron Microscope

FIB
Focused Ion Beam

AFM
Atomic Force Microscope

CLSM
Confocal Laser Scanning Microscope

PSEM
Personal Scanning Electron Microscope

Indenters
Thermal XP Indenter and XP/DCM Indenter

Sample Prep Room
Sample Preparation

XPS Service
X-ray Photoelectron Spectroscopy Service

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