The NCF is happy to offer a special 3 hour course for X-ray Energy Dispersive Spectroscopy (EDS). This course is designed to familiarize researchers with the fundamentals of EDS. The course will be held Monday, August 31, 2009, from 9 am to 12 am, in DLC1B50. To register for the course go to the EDS registration on the NCF website: http://ncf.colorado.edu/?p=eds. Please note that "speedtype" is for internal CU registration only. Please email ncf.colorado.edu if you wish to use MasterCard or VISA as a payment option. Register as soon as possible to assure your place in the course. The featured lecturer will be Dr. Roy Geiss of NIST, who for many years has taught undergraduate and graduate courses on Analhttp://www.cars.gov/faqytical Electron Microscopy including Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), EDS and a wide range of other analysis techniques. He has also been involved with research and commercial development of many of these analysis techniques. He has published many papers on analytical technique development as well as papers on the use of these techniques in the study of materials properties. He has been on the staff at NIST since 2002. In addition he was an IBM research staff member for 19 years, worked in failure analysis at Maxtor Corporation, and taught at the University of Virginia and San Jose State University. The course will provide an overview of the EDS technique, covering both theory and instrumentation. The program includes a lecture, computer simulations and some limited hands-on experience with EDS analysis. Registration Fees: CU students and Faculty $100, Industry users $200 Topics: Introduction to EDS X-Ray Signal Generation EDS Instrumentation & Signal Detection, Silicon Drift Detectors Important EDS Parameters & Detector Geometry Spectrum Interpretation & Artifacts Peak ID/Qualitative Analysis Quantitative X-Ray Analysis X-ray Mapping Techniques and Procedures Thin Films and Particle Analysis Demonstration of DTSA-II, Desktop Spectrum Analyzer, for the PC Summary and Questions